JEDEC Publishes Essential Test Method to Address Switching Energy Loss in Wide Bandgap and Silicon Semiconductor Power Devices

ARLINGTON, Va.–( ORGANIZATION CABLE)– JEDEC Solid State Modern Technology Organization, the international leader in the growth of criteria for the microelectronics market, today introduced the magazine of JEP200: Examination Techniques for Changing Power Loss Connected With Outcome Capacitance Hysteresis in Semiconductor Power Tools. Created collectively by JEDEC’s JC-70.1 Gallium Nitride and JC-70.2 Silicon Carbide Subcommittees, JEP200 is readily available absolutely free download from the JEDEC site. Expansion of soft

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